MTEC MicroLap for Depth Profiling

Enables layer-by-layer FT-IR Spectroscopy of layered and
gradient composition samples with no limit on the depth
range that can be probed.

Produces depth profiles of
composition on a micrometer scale.

Allows measurements of
composition to any desired
depth withou the limitation
of beam penetration distance.		 Utilizes the latest microlapping
technology to precisely remove
material layer-by-layer.

Precision digital gauge monitors
layer removal on a micrometer scale.

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